DIN DIN 50440 Measurement of carrier lifetime in single-crystal silicon at low injection by the photoconductivity method

	Purchase Information Use this form to request purchase information on DIN online subscriptions. DIN Collections First Name: Last Name: Email address:

Document DIN DIN 50440 is offered by IHS as part of an online subscription. This subscription contains many documents on the same topic.

You may also purchase this document alone from the IHS Standards Store.

DIN DIN 50440 Document Information:

Title
Measurement of carrier lifetime in single-crystal silicon at low injection by the photoconductivity method

Pruefung von Materialien fuer die Halbleitertechnologie - Messung der Traegerlebensdauer in Silicium-Einkristallen - Rekombinations-Traegerlebensdauer bei geringer Injektion nach dem Photoleitfaehigkeitsverfahren

Deutsches Institut Fur Normung E.V.

Publication Date:
Nov 1, 1998

Keywords:

Halbleitertechnologie

Materialpruefung

About IHS
IHS (NYSE: IHS) is a leading global provider of critical technical information, decision-support tools and related services in a number of industries including aerospace and defense, automotive, construction, electronics, and energy. IHS serves customers ranging from large governments and multinational corporations to smaller companies and technical professionals in more than 100 countries. IHS been in business for more than 45 years and employ more than 2,300 people around the world.